Determination and Analysis of Crystallographic Parameters of Eu<sub>2−</sub><i><sub>x</sub></i>Ce<i><sub>x</sub></i>CuO<sub>4+</sub><i><sub>α</sub></i>&lt

Polycrystalline Eu2−xCexCuO4+α−δ has been successfully synthesized with x = 0.09 and 0.10. The samples were prepared through a standard solid-state reaction method with annealing treatment to reduce the oxygen content. The investigation of the crystallographic parameters of Eu2−xCexCuO4+α−δ material was conducted by using XRD measurements. The crystallite size of the samples was determined and analyzed using the Debye-Scherrer and the Williamson-Hall Plot Method (W-H plot). It was found that the purity for all samples is 100% with tetragonal structure T′ type and CuO2 conduction layer with a planar configuration. The value of the lattice parameter a-axis increases, while the lattice parameter c-axis decreases with the doping concentration of Ce (x). From the lattice parameter analysis, it was found that the Cu-O bond length increased by doping concentration x due to the strain factor and the volume expansion of the unit cell in the ab plane. The crystallite size of the sample increased by doping concentrations both using Debye-Scherrer equation and W-H plot. The crystallite size of samples determined by W-H plot is bigger than that of Debye-Scherrer method. It is because the W-H plot includes the micro-strain effect in the calculation which is coming from lattice imperfection. This result indicated that lattice imperfection such as atom dislocation and defect might occur in Eu2−xCexCuO4+α−δ. Therefore, utilizing the W-H plot is preferred because it provides more detailed data.