Double-Page Quad-Word Alternating Program Disturb for Nand Physical Unclonable Function with Dual-Layer Stable Bit Selection

The Internet of Things (IoT) is rapidly expanding, with 11.7 billion connected devices predicted by 2025. However, this growth brings significant security challenges. Physical Unclonable Functions (PUFs) offer a robust authentication method, leveraging device-specific variations for unique identifiers. NAND flash memory, a widely used non-volatile storage medium, is emerging as a promising candidate for PUF applications due to its inherent manufacturing variations. This paper introduces a novel Double-Page Quad-Word Alternating Program Disturb PUF technique, coupled with a Dual-Layer Stable Bit Selection method, to enhance reliability and mitigate aging effects. Experimental results using commercial NAND flash chips validate the approach, demonstrating randomness at 50 %, uniqueness ranging from 54 % to 64 % and bit error rate (BER) less than 3%.