Microprocessor Loadline Measurement Prediction Using Artificial Intelligence Regression

Simulation to measurement validation is a vital component for computing system power supply design. This paper presents application of AI based regression for predicting power supply impedance measurement. Unlike classical regression approach, proposed probabilistic regression approaches lead to distribution computation which help to predict measurement data based on simulation. Paper presents data from several regression approaches and concludes Bayesian regression as the optimal model with low mean squared error of 8%. Additionally, paper employed considerations, hyperparameter sensitivity. Finally, discusses AI methodology, over-underfitting and prediction accuracy, model insight and guidelines based on measurement verification for 6 power supplies across 2 product generations are provided.

Authors

Institutions

Publication Details

Published
2025-05-24
DOI
https://doi.org/10.1109/iscaie64985.2025.11080843
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Microprocessor Loadline Measurement Prediction Using Artificial Intelligence Regression

Simon Chun Kit See, Sameer Shekhar
VLSI and Analog Circuit Testing
article

Microprocessor Loadline Measurement Prediction Using Artificial Intelligence Regression

Simon Chun Kit See, Sameer Shekhar
article en

Abstract

Simulation to measurement validation is a vital component for computing system power supply design. This paper presents application of AI based regression for predicting power supply impedance measurement. Unlike classical regression approach, proposed probabilistic regression approaches lead to distribution computation which help to predict measurement data based on simulation. Paper presents data from several regression approaches and concludes Bayesian regression as the optimal model with low mean squared error of 8%. Additionally, paper employed considerations, hyperparameter sensitivity. Finally, discusses AI methodology, over-underfitting and prediction accuracy, model insight and guidelines based on measurement verification for 6 power supplies across 2 product generations are provided.

Intel (United States) (US), Intel (Malaysia) (MY)
Openalex Percentile: Top 82%
VLSI and Analog Circuit Testing
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.