Deep Learning-Based Single-Frame Depth Reconstruction Empowered by Indirect Mapping
The precise and efficient 3D measurement has always been the key research focus in fringe projection profilometry, and achieving high-precision 3D measurement using a single pattern is the ultimate goal pursued in this field. In recent years, deep learning-based fringe pattern analysis methods have made significant progress, and based on this, we propose a deep learning-based single-frame fringe projection profilometry. This method trains two parallel U-Nets to restore the wrapped phase and the depth information, respectively, which serve as intermediate variables. Moreover, it combines the phase-depth model and absolute phase renormalization operation for subsequent calculation and phase correction, ensuring the accuracy of the depth information. Experimental results demonstrate that the proposed method can achieve high-precision depth reconstruction from a single fringe pattern in complex and dynamic scenarios, which effectively overcomes the limitations of conventional methods and significantly improves the accuracy and robustness of measurement. The method offers a viable solution for achieving high-precision depth reconstruction using single-frame techniques.
Authors
- Yixin Ji
- Longxiang Zhang
- Jianhua Wang (ORCID: https://orcid.org/0000-0001-6762-7439)
- Wei Wu
Institutions
- Qingdao University of Technology (CN)
Publication Details
- Journal
- IEEE Transactions on Instrumentation and Measurement
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1109/tim.2025.3590858
- Citations
- 2
- Primary Topic
- Optical measurement and interference techniques
- Type
- article
- Field-Weighted Citation Impact
- 2.55
Funders
- Natural Science Foundation of Shandong Province