Deep Learning-Based Single-Frame Depth Reconstruction Empowered by Indirect Mapping

The precise and efficient 3D measurement has always been the key research focus in fringe projection profilometry, and achieving high-precision 3D measurement using a single pattern is the ultimate goal pursued in this field. In recent years, deep learning-based fringe pattern analysis methods have made significant progress, and based on this, we propose a deep learning-based single-frame fringe projection profilometry. This method trains two parallel U-Nets to restore the wrapped phase and the depth information, respectively, which serve as intermediate variables. Moreover, it combines the phase-depth model and absolute phase renormalization operation for subsequent calculation and phase correction, ensuring the accuracy of the depth information. Experimental results demonstrate that the proposed method can achieve high-precision depth reconstruction from a single fringe pattern in complex and dynamic scenarios, which effectively overcomes the limitations of conventional methods and significantly improves the accuracy and robustness of measurement. The method offers a viable solution for achieving high-precision depth reconstruction using single-frame techniques.

Authors

Institutions

Publication Details

Journal
IEEE Transactions on Instrumentation and Measurement
Published
2025-01-01
DOI
https://doi.org/10.1109/tim.2025.3590858
Citations
2
Primary Topic
Optical measurement and interference techniques
Type
article
Field-Weighted Citation Impact
2.55

Funders

Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Deep Learning-Based Single-Frame Depth Reconstruction Empowered by Indirect Mapping

Yixin Ji, Longxiang Zhang, Jianhua Wang, Wei Wu
2 citations
IEEE Transactions on Instrumentation and Measurement
Optical measurement and interference techniques
2.55
article

Deep Learning-Based Single-Frame Depth Reconstruction Empowered by Indirect Mapping

Yixin Ji, Longxiang Zhang, Jianhua Wang, Wei Wu
article en
2 citations

Abstract

The precise and efficient 3D measurement has always been the key research focus in fringe projection profilometry, and achieving high-precision 3D measurement using a single pattern is the ultimate goal pursued in this field. In recent years, deep learning-based fringe pattern analysis methods have made significant progress, and based on this, we propose a deep learning-based single-frame fringe projection profilometry. This method trains two parallel U-Nets to restore the wrapped phase and the depth information, respectively, which serve as intermediate variables. Moreover, it combines the phase-depth model and absolute phase renormalization operation for subsequent calculation and phase correction, ensuring the accuracy of the depth information. Experimental results demonstrate that the proposed method can achieve high-precision depth reconstruction from a single fringe pattern in complex and dynamic scenarios, which effectively overcomes the limitations of conventional methods and significantly improves the accuracy and robustness of measurement. The method offers a viable solution for achieving high-precision depth reconstruction using single-frame techniques.

IEEE Transactions on Instrumentation and MeasurementVol. 74
Qingdao University of Technology (CN)
Natural Science Foundation of Shandong Province
Openalex Percentile: Top 10%
Optical measurement and interference techniques
2.55
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Deep Learning-Based Single-Frame Depth Reconstruction Empowered by Indirect Mapping — Yixin Ji, Longxiang Zhang, et al. · IEEE Transactions on Instrumentation and Measurement (2025) | TGRS Research Map | TGRS