Reliable Characterization of SK-1300, MgF2, ZnSe, and Si Substrates in 0.2-4.2 μm Spectral Range
Reliable substrate characterization approach is proposed. Four widely used substrates SK-1300, MgF2, ZnSe, and Si were characterized in a broadband spectral range from 250-4200 nm based on multi-angle measurements. Refractive index accuracy was estimated.
Authors
- V. Matusevich
- Michael K. Trubetskov (ORCID: https://orcid.org/0000-0003-1490-0264)
- Tatiana Amochkina
- Jordi Sancho‐Parramon (ORCID: https://orcid.org/0000-0003-3284-8666)
Institutions
- Max Planck Institute of Quantum Optics (DE)
- Ruđer Bošković Institute (HR)
- Max Planck Computing and Data Facility (DE)
- Daimler (Germany) (DE)
Publication Details
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1364/oic.2025.the.10
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00