Optical characterization of Si-SiO2 quantizing nanolaminates

Quantizing nanolaminates are under development for use as materials with optimized properties for optical interference coatings. The optical dispersion needs another description than simply mixing the basic materials because of the bandgap shift.

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Published
2025-01-01
DOI
https://doi.org/10.1364/oic.2025.we.5
Primary Topic
Semiconductor materials and devices
Type
article
Field-Weighted Citation Impact
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article

Optical characterization of Si-SiO2 quantizing nanolaminates

Stefan Bruns, Jörg Terhürne, Michael K. Trubetskov, Michael Vergöhl et al.
4 links
Semiconductor materials and devices
article

Optical characterization of Si-SiO2 quantizing nanolaminates

Stefan Bruns, Jörg Terhürne, Michael K. Trubetskov, Michael Vergöhl, Thomas Melzig, Tatiana Amochkina, Philipp Farr
article en

Abstract

Quantizing nanolaminates are under development for use as materials with optimized properties for optical interference coatings. The optical dispersion needs another description than simply mixing the basic materials because of the bandgap shift.

Max Planck Institute of Quantum Optics (DE), Fraunhofer Institute for Surface Engineering and Thin Films (DE)
Openalex Percentile: Top 84%
Semiconductor materials and devices
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