Unified Framework for Modeling Parameter-Dependent Optical Constants in Thin-Film Coating Design
A modeling design framework is presented for variable optical property materials beyond wavelength (i.e., thickness, composition, and temperature). Our approach integrates such parameter-dependent variations within the design optimization to further advance optical thin-film engineering.
Authors
- Angelica Drees
- Peter R. Stevenson (ORCID: https://orcid.org/0000-0003-3731-1630)
- Maggie Lankford
- Joseph Peeples
- Lirong Sun (ORCID: https://orcid.org/0000-0002-5035-7601)
- W. H. Southwell
Institutions
- Wright-Patterson Air Force Base (US)
- Solutions Through Innovative Technologies (United States) (US)
- UES (United States) (US)
- Table Mountain Optics (United States) (US)
Publication Details
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1364/oic.2025.thb.7
- Primary Topic
- Thin-Film Transistor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00