Reliability of Optical Thin Film Filters

We have performed accelerated temperature life tests on optical thin film filters. The results show an activation energy of 1.08 eV and extracted a mean-time-to-failure of more than 43 years at T = 50°C. Comments and questions should be directed to the VIAVI Solutions Inc. staff

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Published
2025-01-01
DOI
https://doi.org/10.1364/oic.2025.md.3
Primary Topic
Semiconductor Lasers and Optical Devices
Type
article
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article

Reliability of Optical Thin Film Filters

C.H. Fields
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Semiconductor Lasers and Optical Devices
article

Reliability of Optical Thin Film Filters

C.H. Fields
article en

Abstract

We have performed accelerated temperature life tests on optical thin film filters. The results show an activation energy of 1.08 eV and extracted a mean-time-to-failure of more than 43 years at T = 50°C. Comments and questions should be directed to the VIAVI Solutions Inc. staff

Viavi Solutions (United States) (US)
Openalex Percentile: Top 84%
Semiconductor Lasers and Optical Devices
DOISourceOpenAlex
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Reliability of Optical Thin Film Filters — C.H. Fields · (2025) | TGRS Research Map | TGRS