Thin film interface and bulk characterization via second harmonic generation

We present a method based on SHG phenomena for thin centrosymmetric film characterization. We show measurements and consequent data fitting and their comparison to simulated data. Problems and benefits of this method are discussed.

Authors

Jakub Lukeš
Karel Žídek (ORCID: https://orcid.org/0000-0002-3275-2579)
Vít Kanclíř

Institutions

Technical University of Liberec (CZ)
Czech Academy of Sciences, Institute of Plasma Physics (CZ)

Publication Details

Published: 2025-01-01
DOI: https://doi.org/10.1364/oic.2025.wd.4
Primary Topic: Spectroscopy and Quantum Chemical Studies
Type: article
Field-Weighted Citation Impact: 0.00

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article

Thin film interface and bulk characterization via second harmonic generation

Jakub Lukeš, Karel Žídek, Vít Kanclíř

Jan 1, 2025

Spectroscopy and Quantum Chemical Studies

article

Thin film interface and bulk characterization via second harmonic generation

Jakub Lukeš, Karel Žídek, Vít Kanclíř

January 1, 2025article en

Abstract

Technical University of Liberec (CZ), Czech Academy of Sciences, Institute of Plasma Physics (CZ)

Openalex Percentile: Top 87%

Spectroscopy and Quantum Chemical Studies

DOI Source OpenAlex

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Thin film interface and bulk characterization via second harmonic generation — Jakub Lukeš, Karel Žídek, et al. · (2025) | TGRS Research Map | TGRS