Novel LIDT Measurement Routine for Coating Optimization of Low Defect Density Optics in Nanosecond Pulse Regime
A novel LIDT measurement routine suitable for coating optimization of low defect density optics in the nanosecond pulse regime is presented. Results of a high reflectance mirror irradiated according to this routine are discussed.
Authors
- Henrik Ehlers (ORCID: https://orcid.org/0000-0002-6467-0762)
- Kevin Kiedrowski (ORCID: https://orcid.org/0009-0001-7159-3988)
- Heinrich Mädebach
- Andreas Wienke (ORCID: https://orcid.org/0000-0002-8927-6534)
- Alexander K. H. Weiss (ORCID: https://orcid.org/0000-0002-0166-8630)
- Morten Steinecke (ORCID: https://orcid.org/0000-0002-4124-3039)
- Marco Jupé
Institutions
- Leibniz University Hannover (DE)
- Laser Zentrum Hannover (DE)
Publication Details
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1364/oic.2025.me.2
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00