Multi-Angle Photometric Measurements of Specular and Diffuse Samples

Automated, angle-dependent spectroscopic measurements of large wafers or multiple smaller optical components provide more data for controlling material quality. Reflectance data for specular and diffuse samples using the Cary Spectrophotometer’s UMA are presented.

Authors

Scott Melis (ORCID: https://orcid.org/0000-0001-8512-1589)

Institutions

Agilent Technologies (United States) (US)

Publication Details

Published: 2025-01-01
DOI: https://doi.org/10.1364/oic.2025.wd.6
Primary Topic: Surface Roughness and Optical Measurements
Type: article
Field-Weighted Citation Impact: 0.00

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article

Multi-Angle Photometric Measurements of Specular and Diffuse Samples

Scott Melis

Jan 1, 2025

Surface Roughness and Optical Measurements

article

Multi-Angle Photometric Measurements of Specular and Diffuse Samples

Scott Melis

January 1, 2025article en

Abstract

Agilent Technologies (United States) (US)

Openalex Percentile: Top 81%

Surface Roughness and Optical Measurements

DOI Source OpenAlex

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Multi-Angle Photometric Measurements of Specular and Diffuse Samples — Scott Melis · (2025) | TGRS Research Map | TGRS