Optical Properties of VO2 Film Encapsulated by High- and Low-Index Oxide Layer Materials
This study aims to characterize the refractive index of VO 2 phase change thin films grown on different dielectric materials and substrates, using spectroscopic ellipsometry.
Authors
- Angelica Drees
- Andrew Sarangan (ORCID: https://orcid.org/0000-0002-4799-1978)
- Peter R. Stevenson (ORCID: https://orcid.org/0000-0003-3731-1630)
- Lirong Sun
Institutions
- University of Dayton (US)
- Wright-Patterson Air Force Base (US)
- Solutions Through Innovative Technologies (United States) (US)
Publication Details
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1364/oic.2025.fa.7
- Primary Topic
- Transition Metal Oxide Nanomaterials
- Type
- article
- Field-Weighted Citation Impact
- 0.00