Characterization of PARMS Produced 1-μm thick Ta2O5 and SiO2 Monolayers in 0.35-5 μm Spectral Range

Layer materials combination Ta 2 O 5 /SiO 2 is widely used for production of optical coatings in the broadband spectral ranges. Optical properties of PARMS produced monolayers were characterized based on spectral and ellipsometric data using two software tools.

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Published
2025-01-01
DOI
https://doi.org/10.1364/oic.2025.tb.7
Primary Topic
Semiconductor materials and devices
Type
article
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article

Characterization of PARMS Produced 1-μm thick Ta2O5 and SiO2 Monolayers in 0.35-5 μm Spectral Range

Michael K. Trubetskov, Tatiana Amochkina, Vesna Janicki, Nadzeya Khinevich et al.
Semiconductor materials and devices
article

Characterization of PARMS Produced 1-μm thick Ta2O5 and SiO2 Monolayers in 0.35-5 μm Spectral Range

Michael K. Trubetskov, Tatiana Amochkina, Vesna Janicki, Nadzeya Khinevich, Jordi Sancho‐Parramon, А. С. Мысливец
article en

Abstract

Layer materials combination Ta 2 O 5 /SiO 2 is widely used for production of optical coatings in the broadband spectral ranges. Optical properties of PARMS produced monolayers were characterized based on spectral and ellipsometric data using two software tools.

Applied Photonics (United Kingdom) (GB), Max Planck Institute of Quantum Optics (DE), Ruđer Bošković Institute (HR), Max Planck Computing and Data Facility (DE)
Openalex Percentile: Top 84%
Semiconductor materials and devices
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