Exploring the Structure, Optical and Electronic Properties of New PVA–PEO–Ba–Si3N4 Structures for Electronics Applications

The present work aims to design the new PVA-PEO-Ba-Si 3 N 4 structures to use them in various optoelectronics nanodevices.The structural, thermal, optical and electronic characteristics of PVA-PEO-Ba-Si 3 N 4 structures are studied.The structure of PVA-PEO-Ba-Si 3 N 4 is analysed by GaussView 5.0.8 and relaxed using the Gaussian 09 package of programs employing the density functional theory (DFT) with the B3LYP/LanL2DZ level.The studied characteristics of PVA-PEO-Ba-Si 3 N 4 structures include the energy, ionization potentials, energy gap, and electron affinity.The PVA-PEO-Ba-Si 3 N 4 structures are optimized successfully with the Gaussian 09 package.The results show that the PVA-PEO-Ba-Si 3 N 4 structures have good optical and electronic properties.In addition, the PVA-PEO-Ba-Si 3 N 4 nanostructures have wide absorption spectrum that makes the PVA-PEO-Ba-Si 3 N 4 structures suitable in various electronics devices like transistors, photovoltaic cell, sensors and other devices.

Publication Details

Journal
Nanosistemi Nanomateriali Nanotehnologii
Published
2024-09-01
DOI
https://doi.org/10.15407/nnn.22.03.699
Primary Topic
Chalcogenide Semiconductor Thin Films
Type
article
Field-Weighted Citation Impact
0.00
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article

Exploring the Structure, Optical and Electronic Properties of New PVA–PEO–Ba–Si3N4 Structures for Electronics Applications

Nanosistemi Nanomateriali Nanotehnologii
Chalcogenide Semiconductor Thin Films
article

Exploring the Structure, Optical and Electronic Properties of New PVA–PEO–Ba–Si3N4 Structures for Electronics Applications

article en

Abstract

The present work aims to design the new PVA-PEO-Ba-Si 3 N 4 structures to use them in various optoelectronics nanodevices.The structural, thermal, optical and electronic characteristics of PVA-PEO-Ba-Si 3 N 4 structures are studied.The structure of PVA-PEO-Ba-Si 3 N 4 is analysed by GaussView 5.0.8 and relaxed using the Gaussian 09 package of programs employing the density functional theory (DFT) with the B3LYP/LanL2DZ level.The studied characteristics of PVA-PEO-Ba-Si 3 N 4 structures include the energy, ionization potentials, energy gap, and electron affinity.The PVA-PEO-Ba-Si 3 N 4 structures are optimized successfully with the Gaussian 09 package.The results show that the PVA-PEO-Ba-Si 3 N 4 structures have good optical and electronic properties.In addition, the PVA-PEO-Ba-Si 3 N 4 nanostructures have wide absorption spectrum that makes the PVA-PEO-Ba-Si 3 N 4 structures suitable in various electronics devices like transistors, photovoltaic cell, sensors and other devices.

Nanosistemi Nanomateriali NanotehnologiiVol. 22(3)
Openalex Percentile: Top 72%
Chalcogenide Semiconductor Thin Films
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