Modernization of the Hardness Tester Microscope from the MEI T-7 Device

The outrageous control of the mechanical properties of metal directly in mechanical engineering products is one of the main areas of work of the technological testing research laboratories. With the increasing share of aging industrial equipment, work on the outrageous control of metal properties is becoming more and more in demand. The MEI T-7 device was developed based on the MHV-1 hardness tester microscope in the second half of the twentieth century and needs some modernization. As part of joint initiative a model of a hardness tester microscope was created with a reduction in the size of the prism head and the replacement of the light source with a more autonomous LED lamp compared to an incandescent lamp. The article presents a calculation of the optical system of a microscope with the replacement of a standard reflective prism with a semi-pentaprism. A 3D model of a hardness tester microscope is presented. It is shown that the claimed fields of view and the microscope dividing value are provided by the solutions inherent in the design. The results of the mock-up of a hardness tester microscope are presented, including the results of measuring the division value of the microscope.

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Published
2025-06-30
DOI
https://doi.org/10.1109/synchroinfo65403.2025.11079344
Primary Topic
Advanced Measurement and Metrology Techniques
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article
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article

Modernization of the Hardness Tester Microscope from the MEI T-7 Device

A. Yu. Marchenkov, O. V. Pechinskaya, G. B. Sviridov
Advanced Measurement and Metrology Techniques
article

Modernization of the Hardness Tester Microscope from the MEI T-7 Device

A. Yu. Marchenkov, O. V. Pechinskaya, G. B. Sviridov
article en

Abstract

The outrageous control of the mechanical properties of metal directly in mechanical engineering products is one of the main areas of work of the technological testing research laboratories. With the increasing share of aging industrial equipment, work on the outrageous control of metal properties is becoming more and more in demand. The MEI T-7 device was developed based on the MHV-1 hardness tester microscope in the second half of the twentieth century and needs some modernization. As part of joint initiative a model of a hardness tester microscope was created with a reduction in the size of the prism head and the replacement of the light source with a more autonomous LED lamp compared to an incandescent lamp. The article presents a calculation of the optical system of a microscope with the replacement of a standard reflective prism with a semi-pentaprism. A 3D model of a hardness tester microscope is presented. It is shown that the claimed fields of view and the microscope dividing value are provided by the solutions inherent in the design. The results of the mock-up of a hardness tester microscope are presented, including the results of measuring the division value of the microscope.

Moscow Power Engineering Institute (RU)
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Advanced Measurement and Metrology Techniques
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