One-dimensional scanning ptychographic imaging based on dual-mask modulation
In ptychographic imaging, two-dimensional scanning is necessary because one-dimensional scanning will produce artifacts in the reconstructed images. Two electric translation stages are then required, which increases the cost and complexity of the imaging system. In this paper, a new one-dimensional scanning ptychographic imaging method free of reconstruction artifacts is proposed. Two random binary amplitude masks are inserted upstream of the object. The incident light is sequentially modulated by the two masks and then illuminates the sample. By fixing one of the masks and translating the other laterally, the probe light on the object surface not only moves but also changes in intensity. Consequently, the reconstruction artifacts inherent in original one-dimensional ptychographic imaging can be eliminated. Simulations and experiments are conducted to validate the proposed method, and a comparison with the original near-field ptychography is also carried out.
Authors
- Axiu Cao (ORCID: https://orcid.org/0000-0003-1943-184X)
- Jun Lan (ORCID: https://orcid.org/0000-0001-5072-5315)
- Hui Pang (ORCID: https://orcid.org/0000-0001-9590-0308)
- Cheng Xu (ORCID: https://orcid.org/0009-0005-4993-4853)
- Qiling Deng
Institutions
- Chinese Academy of Sciences (CN)
- University of Chinese Academy of Sciences (CN)
Publication Details
- Journal
- Optics Express
- Published
- 2025-07-21
- DOI
- https://doi.org/10.1364/oe.563076
- Primary Topic
- Advanced X-ray Imaging Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00