Radiation Effects of Advanced Electronic Devices and Circuits, 2nd Edition
In recent years, the expanding use of advanced electronics in harsh radiation environments has heightened reliability demands, prompting extensive research into radiation-effect modeling and advanced radiation hardening design methodologies that serve these applications [...]
Authors
- Chang Cai (ORCID: https://orcid.org/0000-0001-6624-8998)
- Li Cai (ORCID: https://orcid.org/0000-0001-6737-7396)
- Yaqing Chi (ORCID: https://orcid.org/0000-0001-9299-963X)
Institutions
- National University of Defense Technology (CN)
- Chinese Academy of Sciences (CN)
- Guangzhou University (CN)
- Institute of Modern Physics (CN)
Publication Details
- Journal
- Electronics
- Published
- 2025-07-19
- DOI
- https://doi.org/10.3390/electronics14142896
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China
- National University of Defense Technology
- Basic and Applied Basic Research Foundation of Guangdong Province