Statistical Analysis of the Rotation Induced Decay of the Contrast in an Onboard Atom Interferometer
We present a statistical analysis of the measurement noise of an atom interferometer under large phase and contrast noise caused by rotation fluctuations. The extraction of the standard deviation of the contrast fluctuations out of transition probability measurements allows us to determine the level of rotation noise applied to the onboard instrument. We include an experimental validation of the method.
Authors
- Franck Pereira dos Santos (ORCID: https://orcid.org/0000-0003-0659-5028)
- Leonid A. Sidorenkov (ORCID: https://orcid.org/0000-0001-5293-2780)
- Joel Gomes Baptista
- Sébastien Merlet (ORCID: https://orcid.org/0000-0002-4746-2400)
- Quentin Beaufils (ORCID: https://orcid.org/0000-0002-1678-2831)
- Benoît Kaczmarczuk
Institutions
- Centre National de la Recherche Scientifique (FR)
- Université Paris Sciences et Lettres (FR)
- Observatoire de Paris (FR)
- Sorbonne Université (FR)
Publication Details
- Journal
- IEEE Sensors Journal
- Published
- 2025-07-14
- DOI
- https://doi.org/10.1109/jsen.2025.3586409
- Primary Topic
- Radioactive Decay and Measurement Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- European Defence Fund
- Agence Nationale de la Recherche