Experimental device-independent efficient certification of unsharp measurements

Unsharp measurement is a unique type of measurement which provides a tradeoff between information gain and state disturbance. Such measurement is a crucial method in quantum theory and shows potential in various applications. We propose a device-independent scheme for certifying unsharp measurements with binary outcome in an efficient manner. Our scheme has low consumption of measurement resources and is robust against noise. In experiment, we demonstrate the certification of a typical kind of unsharp measurements. We achieve high fidelities above 0.9 when the strength of the unsharp measurement is less than 0.6 and get near unity fidelities in the low measurement strength range. Our scheme can be applied to enhance the feasibility and practicability of device-independent quantum information processing tasks.

Authors

Institutions

Publication Details

Journal
Physical Review Research
Published
2025-07-14
DOI
https://doi.org/10.1103/17yy-55y8
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Experimental device-independent efficient certification of unsharp measurements

Zhenda Xie, Yan-Xiao Gong, Ran Yang, Xinhui Li et al.
Physical Review Research
Integrated Circuits and Semiconductor Failure Analysis
article

Experimental device-independent efficient certification of unsharp measurements

Zhenda Xie, Yan-Xiao Gong, Ran Yang, Xinhui Li, Yichen Liu, Shining N. Zhu, Linrunde Tao, Karl J. Friston
article en

Abstract

Unsharp measurement is a unique type of measurement which provides a tradeoff between information gain and state disturbance. Such measurement is a crucial method in quantum theory and shows potential in various applications. We propose a device-independent scheme for certifying unsharp measurements with binary outcome in an efficient manner. Our scheme has low consumption of measurement resources and is robust against noise. In experiment, we demonstrate the certification of a typical kind of unsharp measurements. We achieve high fidelities above 0.9 when the strength of the unsharp measurement is less than 0.6 and get near unity fidelities in the low measurement strength range. Our scheme can be applied to enhance the feasibility and practicability of device-independent quantum information processing tasks.

Physical Review ResearchVol. 7(3)
Hefei University (CN), Collaborative Innovation Center of Advanced Microstructures (CN), Qingdao University of Technology (CN), Nanjing University (CN)
Openalex Percentile: Top 85%
Integrated Circuits and Semiconductor Failure Analysis
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Experimental device-independent efficient certification of unsharp measurements — Zhenda Xie, Yan-Xiao Gong, et al. · Physical Review Research (2025) | TGRS Research Map | TGRS