Robust Topological Voltage Divider Induced by π−Phase$\pi -{\rm Phase}$ Factor in the Dimerized Electronic Circuit Lattice with Long‐Range Hopping

Abstract The robust topological voltage distribution phenomenon is demonstrated in the circuit mapped by a Su‐Schrieffer‐Heeger model with long‐range hopping. When long‐range hopping is equal to intercell hopping or negative intercell hopping, where the system experiences phase transition, the circuit exhibits the same voltage at certain sites, and the latter case shows greater robustness than the former. This reason is that the later case with factor in the hopping has a larger gap width compared with the former case. Besides, the longer‐range hopping can change the positions of sites that have equal voltage distribution. It is shown that the robust topological distribution phenomenon can be realized in a real electronic circuit lattice, where some circuit nodes have equal voltage distribution. The equal voltage distribution at certain nodes can serve as a topologically protected voltage divider device, i.e., a topological voltage divider. The robust topological voltage divider shows the favorable effects of phase factor on the real physical system and provides an illuminating example to construct robust electronic device based on topological physics, which may promote the application of topological band theory in developing electronics.