Novel Method for Balancing Full Wheatstone Bridge for High-Tolerance Resistive Sensors
Wheatstone bridge (WB) is widely used in precision measurements involving strain gauges and resistive sensors. However, maintaining balance in a full-bridge configuration becomes increasingly challenging in the presence of high-resistance tolerances—especially in printed electronics, where such variations are common. Traditional compensation methods often entail increased circuit complexity, added cost, and additional sources of error. This article proposes a novel balancing technique for fully resistive WBs, leveraging two voltage References to cancel the output offset even in the presence of resistor tolerances exceeding 0.1%. The method demonstrates robust performance with tolerance levels up to 20%, while preserving high linearity. Simulation results confirm that the approach achieves balanced operation and accurate output even with low-tolerance resistors (1%). Relative to the ideal sensitivity of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$(V_{\text {CC}}-{V}_{\text {EE}})$ </tex-math></inline-formula>, the proposed technique maintains a worst-case sensitivity of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$0.8~({V}_{\text {CC}}-{V}_{\text {EE}})$ </tex-math></inline-formula>, with a theoretically null output offset under balanced conditions. Furthermore, linearity error remains below 0.5% of the full-scale output (FSO), matching the performance of conventional WB circuits affected by mismatch. While the resolution of the voltage references introduces a small, predictable offset—independent of power supply variations—this error is limited to the resolution of the reference itself. Experimental validation using benchtop instrumentation corroborates the simulation findings: with resistors exhibiting 10% tolerance, the maximum deviation between measured and theoretical outputs was 2.4 mV. This deviation remains negligible in terms of estimating fractional resistance changes.
Authors
- Michela Borghetti (ORCID: https://orcid.org/0000-0002-1641-1790)
- Mauro Serpelloni (ORCID: https://orcid.org/0000-0001-6497-5876)
- Óscar Casas (ORCID: https://orcid.org/0000-0002-0077-0561)
- Emilio Sardini (ORCID: https://orcid.org/0000-0001-8629-7316)
Institutions
- University of Brescia (IT)
- Universitat Politècnica de Catalunya (ES)
Publication Details
- Journal
- IEEE Transactions on Instrumentation and Measurement
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1109/tim.2025.3586341
- Citations
- 2
- Primary Topic
- Sensor Technology and Measurement Systems
- Type
- article
- Field-Weighted Citation Impact
- 2.97
Funders
- Agencia Estatal de Investigación