Solution‐Processed High‐Resolution Solid Frisch‐Grid Perovskite Detector for Hard Radiation

Abstract Semiconductor detectors function as solid‐state ionization chambers, operating on principles similar to those of gas ionization chambers. In a gas ionization chamber, the internal grid structure is a critical regulator in providing electrical shielding and facilitating event‐trajectory reconstruction. However, grid structure has yet to be implemented into state‐of‐art semiconductor detectors. Herein, the conceptual design and operation principle of a solid Frisch grid (SFG) detector is presented with an internal grid structure, alongside a universal strategy for its fabrication utilizing solution‐processed perovskite semiconductors. Spectroscopic‐grade SFG perovskite single crystals with smooth surfaces, showcasing atomic‐level growth terraces, are grown through bulk defects passivation with additive. SFG detector exhibits desirable weighting potential with a low grid inefficiency of ≈17.1%, delivering an impressive raw energy resolution of 2.0% at 662 keV, surpassing that of conventional detectors without a Frisch grid. By incorporating depth analysis, the energy resolution is further enhanced to an unprecedented 1.65%. A multiple‐wire SFG detector has also been developed, capable of spatially reconstructing the γ‐ray interaction events and achieving a record 40.0 µm position resolution. With the significantly higher attenuation efficiency of SFG perovskite detector, which is four orders of magnitude greater than that of gas detector, this study is anticipated to pave the avenue for integrating grid structures with versatile functionality into new‐generation semiconductor radiation detectors.