A Survey on Transistor-Level Electrical Rule Checking of Integrated Circuits

Hardware verification is crucial to ensure the quality of Integrated Circuits, and prevent costly bugs down the manufacturing flow. Electrical Rule Checking (ERC) is a verification step used to assert that a circuit complies with some electrical rules, from the absence of short-circuits to dedicated constructor rules. In this survey, we provide a global overview of existing ERC techniques at transistor-level, where voltage values are explicit. We propose a new classification method to compare the existing approaches based on their semantic modeling of circuits. This survey precisely describes transistor-level ERC research challenges and existing solutions. We believe it will help structure this research domain by positioning existing approaches with respect to each other. Obviously, a survey should also facilitate technological transfer and this one should help CAD vendors identify the most relevant approaches to integrate in their tools. Finally, we highlight several promising directions to improve the existing solutions.

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Publication Details

Journal
ACM Transactions on Design Automation of Electronic Systems
Published
2025-07-12
DOI
https://doi.org/10.1145/3748327
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
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article

A Survey on Transistor-Level Electrical Rule Checking of Integrated Circuits

Oussama Oulkaid, Pascal Raymond, Mehdi Khosravian Ghadikolaei, Bruno Ferres et al.
ACM Transactions on Design Automation of Electronic Systems
VLSI and Analog Circuit Testing
article

A Survey on Transistor-Level Electrical Rule Checking of Integrated Circuits

Oussama Oulkaid, Pascal Raymond, Mehdi Khosravian Ghadikolaei, Bruno Ferres, Matthieu Moy, Gabriel Radanne, Ludovic Henrio
article en

Abstract

Hardware verification is crucial to ensure the quality of Integrated Circuits, and prevent costly bugs down the manufacturing flow. Electrical Rule Checking (ERC) is a verification step used to assert that a circuit complies with some electrical rules, from the absence of short-circuits to dedicated constructor rules. In this survey, we provide a global overview of existing ERC techniques at transistor-level, where voltage values are explicit. We propose a new classification method to compare the existing approaches based on their semantic modeling of circuits. This survey precisely describes transistor-level ERC research challenges and existing solutions. We believe it will help structure this research domain by positioning existing approaches with respect to each other. Obviously, a survey should also facilitate technological transfer and this one should help CAD vendors identify the most relevant approaches to integrate in their tools. Finally, we highlight several promising directions to improve the existing solutions.

ACM Transactions on Design Automation of Electronic SystemsVol. 30(5)
Université Claude Bernard Lyon 1 (FR), Institut polytechnique de Grenoble (FR), École Normale Supérieure de Lyon (FR), Centre National de la Recherche Scientifique (FR), Verimag (FR), Caspian University (KZ), Université Grenoble Alpes (FR)
Industry, innovation and infrastructure
Openalex Percentile: Top 83%
VLSI and Analog Circuit Testing
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A Survey on Transistor-Level Electrical Rule Checking of Integrated Circuits — Oussama Oulkaid, Pascal Raymond, et al. · ACM Transactions on Design Automation of Electronic Systems (2025) | TGRS Research Map | TGRS