A Fast Deskew Algorithm for V-I Alignment in Double Pulse Test of Wide-Bandgap Devices

When performing Double Pulse Testing (DPT) to evaluate the dynamic switching characteristics of semiconductor devices, accurately aligning the current and voltage waveforms is crucial. For the latest wide-bandgap (WBG) devices with very high switching speed, even minor misalignments between both waveforms can lead to significant errors in switching loss evaluation. Current deskew solutions, whether based on dedicated fixtures or data post-processing, are often time-consuming and prone to inaccuracies. The paper will provide a brief survey of latest deskew methods and introduces a novel algorithm for fast and accurate deskewing. The proposed method leverages the inherent V-I relationship between current and voltage waveforms during DPT, enabling a rapid deskew process while ensuring precise results. The algorithm is validated through DPT of SiC devices, demonstrating satisfactory outcome which are very close to traditional methods. These results validate the algorithm's effectiveness and highlight its potential for accelerating the deskewing process.