Automatic PSP MOSFET model card extraction powered by deep learning

The semiconductor industry’s need for efficient model card extraction is addressed by a Deep-Learning-powered tool that automates this process for PSP MOSFETs. 59 parameters are predicted with an average 2.06% error, reducing extraction time from weeks to one day, enabling statistical analysis and improving workflow efficiency.

Authors

Institutions

Publication Details

Published
2025-03-24
DOI
https://doi.org/10.1109/icmts63811.2025.11068923
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Automatic PSP MOSFET model card extraction powered by deep learning

François Paolini, Lioua Labrak, Elouan Vincent, Nacer Abouchi et al.
Integrated Circuits and Semiconductor Failure Analysis
article

Automatic PSP MOSFET model card extraction powered by deep learning

François Paolini, Lioua Labrak, Elouan Vincent, Nacer Abouchi, John Samuel, Fabien Gilibert, Matthieu Quoirin, Alan Gerard, N. Derrier, Pascal Urard, Alba Ordonez Rodriguez, Rémy Cellier
article en

Abstract

The semiconductor industry’s need for efficient model card extraction is addressed by a Deep-Learning-powered tool that automates this process for PSP MOSFETs. 59 parameters are predicted with an average 2.06% error, reducing extraction time from weeks to one day, enabling statistical analysis and improving workflow efficiency.

Université Claude Bernard Lyon 1 (FR), Centre National de la Recherche Scientifique (FR), Institut des Nanotechnologies de Lyon (FR), STMicroelectronics (India) (IN), STMicroelectronics (France) (FR), Laboratoire d'Informatique en Images et Systèmes d'Information (FR), École d'Ingénieurs en Chimie et Sciences du Numérique (FR)
Openalex Percentile: Top 85%
Integrated Circuits and Semiconductor Failure Analysis
DOISourceOpenAlex
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Automatic PSP MOSFET model card extraction powered by deep learning — François Paolini, Lioua Labrak, et al. · (2025) | TGRS Research Map | TGRS