Planar Wide-Angle Imaging System with a Single-Layer SiC Metalens
Optical systems with wide field-of-view (FOV) imaging capabilities are crucial for applications ranging from biomedical diagnostics to remote sensing, yet conventional wide-angle optics face integration challenges in compact platforms. Here, we present the design and experimental demonstration of a single-layer silicon carbide (SiC) metalens achieving a 90° total FOV, whose planar structure and small footprint address the challenges. This design is driven by a gradient-based numerical optimization strategy, Gradient-Optimized Phase Profile Shaping (GOPP), which optimizes the phase profile to accommodate the angle-dependent requirements. Combined with a front aperture, the GOPP-generated phase profile enables off-axis aberration control within a planar structure. Operating at 803 nm with a focal length of 1 mm (NA = 0.25), the fabricated metalens demonstrated focusing capabilities across the wide FOV, enabling effective wide-angle imaging. This work demonstrates the feasibility of using numerical optimization to realize single-layer metalens with challenging wide FOV capabilities, offering a promising route towards highly compact imagers for applications such as endoscopy and dermoscopy.
Authors
- Qiangbo Zhang
- Zhenrong Zheng (ORCID: https://orcid.org/0000-0002-4586-6268)
- Changwei Zhang (ORCID: https://orcid.org/0000-0002-9741-7915)
- Yiyang Liu (ORCID: https://orcid.org/0000-0002-5846-7354)
- Mengguang Wang
Institutions
- Zhejiang University (CN)
Publication Details
- Journal
- Nanomaterials
- Published
- 2025-07-05
- DOI
- https://doi.org/10.3390/nano15131046
- Primary Topic
- Metamaterials and Metasurfaces Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Key Research and Development Program of China