Advancing Electron Microscopy: The Role of the MARS in Magnetic Field-Free Imaging

Abstract Transmission electron microscopy (TEM) has long been constricted by the need to place samples within high-magnetic fields during imaging, limiting direct atomic-resolution examination of magnetic materials. The JEOL MARS (Magnetic field-free Atomic Resolution imaging System, JEM-Z200MF) represents a revolution in TEM by enabling atomic-resolution imaging in a magnetic field-free environment. By incorporating a new objective lens system that realizes a magnetic field-free environment at the sample position, the MARS enables direct and atomic-level observation of samples without unwanted high-magnetic field effects.