Polarization Reconstruction Based on Monte Carlo Simulations for a Compton Polarimeter
State-of-the-art 2D sensitive semiconductor detectors developed within the SPARC collaboration can be utilized as dedicated Compton polarimeters in the hard X-ray regime. We report on the technique of Compton polarimetry utilizing such a detector and present a method to determine the linear polarization of an analyzed hard X-ray beam by means of Monte-Carlo-simulated data sets.
Authors
- G. Weber (ORCID: https://orcid.org/0000-0002-0833-8028)
- Wilko Middents (ORCID: https://orcid.org/0000-0001-8105-4657)
- Th. Stöhlker (ORCID: https://orcid.org/0000-0003-0461-3560)
- T. Over (ORCID: https://orcid.org/0000-0001-9737-3193)
Institutions
- Helmholtz Institute Jena (DE)
- GSI Helmholtz Centre for Heavy Ion Research (DE)
- Friedrich Schiller University Jena (DE)
Publication Details
- Journal
- Atoms
- Published
- 2025-07-04
- DOI
- https://doi.org/10.3390/atoms13070065
- Citations
- 1
- Primary Topic
- Nuclear Physics and Applications
- Type
- article
- Field-Weighted Citation Impact
- 1.88
Funders
- Bundesministerium für Bildung und Forschung