Extracting Circuit Parameters from Multimodal Cavities for Lumped Element Simulations

Many digital and analog circuits in electronic devices are placed inside metal cavities. In most cases, interference between the circuit and surrounding cavity or radiative sources outside the cavity is negligible, so it is often ignored in modeling. However, in some cases these electromagnetic fields in the cavity couple to traces on the circuit board, which could potentially cause errors such as bit flips. Modeling interference between cavities and large-scale circuits could theoretically be done with full-wave methods, but would require enough degrees of freedom to be computationally prohibitive.