Structure and dielectric behavior of MnxZn1-xTiO3, (x = 0.1, 0.3, & 0.5) ceramics for microwave applications with enhanced permittivity

The microstructure and dielectric properties of manganese-doped zinc titanate (MnxZn1-xTiO?) ceramics were systematically studied for varying manganese concentrations (x = 0.1, 0.3, and 0.5). X-ray diffraction analysis confirmed the formation of a single-phase ilmenite-type hexagonal structure, reflecting the structural evolution with dopant concentration. Dielectric measurements revealed that the dielectric constant increased significantly with both manganese doping and temperature, while it decreased with increasing frequency. Similarly, dielectric loss exhibited a temperature-dependent rise and frequency-dependent decline. Notably, the partial substitution of Zn?? by Mn?? ions led to enhanced dielectric behavior, with the dielectric constant increasing by up to ~80%. These improvements underscore the material?s potential for use in high-performance dielectric and electronic applications.