WRTU-16T: Write-Enhanced Low-Power Radiation-Tolerant SRAM for Space Applications

In space, high-energy particle radiation poses a serious threat to the data stability and reliability of SRAM. Existing radiation-tolerant techniques, such as Triple Modular Redundancy (TMR) and Error Correction Code (ECC), have disadvantages such as large area, high power consumption, and additional delay, making them unsuitable for small satellite systems. To overcome these limitations, this paper proposes a 16-transistor-based radiation-tolerant SRAM cell, WRTU-16T, which applies a read-decoupled structure and a charge-sharing suppression mechanism. The proposed structure effectively isolates the storage node from external disturbances and improves the recovery capability for single-event inversion (SEU) and multiple-node inversion (SEMNU) by reducing charge loss. WRTU-16T shows superior performance in terms of write delay, charge recovery capability (Qc), hold power, and word line write threshold voltage (WWTV) compared to existing radiation-tolerant SRAM designs. The integrated circuit is implemented using a 90 nm CMOS process and has an operating voltage of 1V.

Authors

Publication Details

Journal
Applied Sciences
Published
2025-06-28
DOI
https://doi.org/10.3390/app15137295
Primary Topic
Radiation Effects in Electronics
Type
article
Field-Weighted Citation Impact
0.00

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article

WRTU-16T: Write-Enhanced Low-Power Radiation-Tolerant SRAM for Space Applications

Sung-Hun Jo, Seung-Hyun Lee
Applied Sciences
Radiation Effects in Electronics
article

WRTU-16T: Write-Enhanced Low-Power Radiation-Tolerant SRAM for Space Applications

Sung-Hun Jo, Seung-Hyun Lee
article en

Abstract

In space, high-energy particle radiation poses a serious threat to the data stability and reliability of SRAM. Existing radiation-tolerant techniques, such as Triple Modular Redundancy (TMR) and Error Correction Code (ECC), have disadvantages such as large area, high power consumption, and additional delay, making them unsuitable for small satellite systems. To overcome these limitations, this paper proposes a 16-transistor-based radiation-tolerant SRAM cell, WRTU-16T, which applies a read-decoupled structure and a charge-sharing suppression mechanism. The proposed structure effectively isolates the storage node from external disturbances and improves the recovery capability for single-event inversion (SEU) and multiple-node inversion (SEMNU) by reducing charge loss. WRTU-16T shows superior performance in terms of write delay, charge recovery capability (Qc), hold power, and word line write threshold voltage (WWTV) compared to existing radiation-tolerant SRAM designs. The integrated circuit is implemented using a 90 nm CMOS process and has an operating voltage of 1V.

Applied SciencesVol. 15(13)
IC Design Education Center
Openalex Percentile: Top 86%
Radiation Effects in Electronics
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WRTU-16T: Write-Enhanced Low-Power Radiation-Tolerant SRAM for Space Applications — Sung-Hun Jo, Seung-Hyun Lee · Applied Sciences (2025) | TGRS Research Map | TGRS