B4.2 - Low-Noise Silicon APD with Enhanced Blue-Violet Sensitivity

A theoretical two-carrier formalism for the calculation of the optoelectrical properties of APDs is established based on the independent Bernouilli trial and generating function method.The gain and excess noise factor can be calculated for any doping profile under any bias and illumination wavelength.This is applied to the design of a CMOS compatible low-noise silicon avalanche photodiode.The doping profile and antireflection layer are optimized to achieve enhanced blue-violet sensitivity and low-noise, while keeping the operating bias at a moderate level.The properties of the fabricated APDs are in good agreement with the theoretical analysis.

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Journal
Lectures
Published
2025-01-01
DOI
https://doi.org/10.5162/smsi2025/b4.2
Primary Topic
Thin-Film Transistor Technologies
Type
article
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article

B4.2 - Low-Noise Silicon APD with Enhanced Blue-Violet Sensitivity

Thomas Ortlepp, Martin Schaedel, G. Brokmann, D. Leann Long et al.
Lectures
Thin-Film Transistor Technologies
article

B4.2 - Low-Noise Silicon APD with Enhanced Blue-Violet Sensitivity

Thomas Ortlepp, Martin Schaedel, G. Brokmann, D. Leann Long, Xuejun Xu
article en

Abstract

A theoretical two-carrier formalism for the calculation of the optoelectrical properties of APDs is established based on the independent Bernouilli trial and generating function method.The gain and excess noise factor can be calculated for any doping profile under any bias and illumination wavelength.This is applied to the design of a CMOS compatible low-noise silicon avalanche photodiode.The doping profile and antireflection layer are optimized to achieve enhanced blue-violet sensitivity and low-noise, while keeping the operating bias at a moderate level.The properties of the fabricated APDs are in good agreement with the theoretical analysis.

Lectures
CiS Forschungsinstitut für Mikrosensorik GmbH (DE)
Affordable and clean energy
Openalex Percentile: Top 86%
Thin-Film Transistor Technologies
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