Research on Boundary Displacement of Probe Trajectory Considering Deviations in Five-Axis Sweep Scanning Measurement

Five-axis sweep scanning measurement technology, as a novel contact measurement technology, offers excellent reachability and high measurement efficiency for complex parts. However, deviations between the measurement instructions based on the model and the workpiece exist, leading to mismatches between the intended and actual sweep scanning areas, which manifest as displacements of the scanning boundaries and subsequently impact the acquisition of sampling points. When these sampling points are utilized to evaluate the machining quality of workpieces, the accuracy and reliability of the assessment results are compromised. Therefore, by focusing on the phenomenon of boundary displacement in a five-axis sweep scanning measurement, the sampling principle has been analyzed, the constrained sector for the probe tip trajectory in a five-axis scanning measurement has been defined, and the concept of the trajectory constrained sector effect has been proposed for the first time. The constrained sector effect reveals how deviations affect the scanning boundary positions and acquisition of sampling points. Based on the constrained sector effect, the influence of deviations on boundary displacement and sampling point acquisition in single-patch and multiple-patch measurement scenarios is discussed. Furthermore, practical engineering recommendations are provided, aiming to reduce the impact of deviations on the completeness of sampling point acquisition.