Compositional Community Detection: Automated Identification of Chemical Segregation in Atom Probe Tomography Data

We introduce a fully unsupervised clustering method we call Compositional Community Detection (CCD) to identify chemical motifs in atom probe tomography (APT) reconstructions. In the CCD approach, APT point clouds are broken into overlapping spherical neighborhoods, and repeated k-means clustering coupled with Louvain community detection is used to group neighborhoods based on their ion composition. Kolmogorov-Smirnov statistics for present ion types provide interpretable descriptors of each community that indicate the relative level of enrichment or depletion of ions within a community. We demonstrate our technique on a set of APT reconstructions of irradiated 316 stainless steel. Our method detected chromium carbide and Ni-Si-rich precipitates and located a grain boundary based on Ni and Si enrichment. Spatial correlations between communities indicated that chromium carbide precipitates were flanked by regions of Fe depletion. Our results highlight the potential of CCD in the analysis of chemical segregation in broader classes of materials, in terms of both varying synthesis methods and exposure to extreme environments.

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Publication Details

Journal
Microscopy and Microanalysis
Published
2025-05-09
DOI
https://doi.org/10.1093/mam/ozaf036
Primary Topic
Advanced Materials Characterization Techniques
Type
article
Field-Weighted Citation Impact
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article

Compositional Community Detection: Automated Identification of Chemical Segregation in Atom Probe Tomography Data

David J. Senor, Christina Doty, Mark Wirth, Arun Devaraj et al.
Microscopy and Microanalysis
Advanced Materials Characterization Techniques
article

Compositional Community Detection: Automated Identification of Chemical Segregation in Atom Probe Tomography Data

David J. Senor, Christina Doty, Mark Wirth, Arun Devaraj, Meiping Tong, Jenna A. Bilbrey, Jacqueline Royer
article en

Abstract

We introduce a fully unsupervised clustering method we call Compositional Community Detection (CCD) to identify chemical motifs in atom probe tomography (APT) reconstructions. In the CCD approach, APT point clouds are broken into overlapping spherical neighborhoods, and repeated k-means clustering coupled with Louvain community detection is used to group neighborhoods based on their ion composition. Kolmogorov-Smirnov statistics for present ion types provide interpretable descriptors of each community that indicate the relative level of enrichment or depletion of ions within a community. We demonstrate our technique on a set of APT reconstructions of irradiated 316 stainless steel. Our method detected chromium carbide and Ni-Si-rich precipitates and located a grain boundary based on Ni and Si enrichment. Spatial correlations between communities indicated that chromium carbide precipitates were flanked by regions of Fe depletion. Our results highlight the potential of CCD in the analysis of chemical segregation in broader classes of materials, in terms of both varying synthesis methods and exposure to extreme environments.

Microscopy and MicroanalysisVol. 31(3)
Battelle (US), Pacific Northwest National Laboratory (US)
Sustainable cities and communities
Openalex Percentile: Top 86%
Advanced Materials Characterization Techniques
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