Effect of Stress‐Induced Anisotropy on Dynamic Magnetic Properties of Thin Films

A single‐atom‐layer magnetic thin film model is established, with two mutually perpendicular in‐plane uniaxial anisotropies: an intrinsic anisotropy (along the x ‐axis, denoted as K 1 ) and a stress‐induced anisotropy (along the y ‐axis, denoted as K 2 ). The dynamic behavior of spins is described by the Landau–Lifshitz–Gilbert equation, with calculations performed for spontaneous magnetization, hysteresis loop, alternating current (AC) susceptibility, and resonance linewidth. When , the system exhibits a ferromagnetic state along the x ‐axis, with spontaneous magnetization slightly decreasing as K 2 increases. The switching field and resonance frequency both decrease with increasing K 2 . In the x – y plane, when the angle between the external magnetic field and the x ‐axis is below 45°, the resonance linewidth increases nearly linearly with the AC field frequency. For angles exceeding 45°, the resonance linewidth shows a peak at the low‐frequency zone while maintaining an approximately linear increase at high frequencies. As K 2 increases, this peak shifts toward lower frequencies zone. When K 2 = K 1 , the system approximately exhibits a very narrow hysteresis loop, and the linewidth varies linearly with frequency.