Establishment of measurement traceability of dielectric-constant measurement using contact and non-contact methods
To meet industry demands, measurement traceability for the dielectric constant of solid reference materials has been established at audio and radio frequencies. The dielectric constant is determined using capacitance-based contact and non-contact methods, where the dielectric material is sandwiched between the electrodes of a dielectric test fixture. A precision LCR meter measures the capacitance of solid dielectric materials, and results from contact and non-contact methods align well up to 1 MHz. Measurement uncertainty is evaluated according to the Guide to the Expression of Uncertainty in Measurement, with a detailed discussion of contributing factors.
Authors
- S. Satish
- Rajendra Singh (ORCID: https://orcid.org/0000-0002-6890-6904)
- Jayeeta Biswas (ORCID: https://orcid.org/0000-0002-9322-3136)
- Rajendra K. Meena (ORCID: https://orcid.org/0000-0001-8545-7349)
- Priyanka Jain (ORCID: https://orcid.org/0000-0002-3001-197X)
Institutions
- Delhi Technological University (IN)
- CSIR National Physical Laboratory of India (IN)
Publication Details
- Journal
- ACTA IMEKO
- Published
- 2025-06-11
- DOI
- https://doi.org/10.21014/actaimeko.v14i2.1739
- Citations
- 1
- Primary Topic
- Sensor Technology and Measurement Systems
- Type
- article
- Field-Weighted Citation Impact
- 1.49
Funders
- National Physical Laboratory