Establishment of measurement traceability of dielectric-constant measurement using contact and non-contact methods

To meet industry demands, measurement traceability for the dielectric constant of solid reference materials has been established at audio and radio frequencies. The dielectric constant is determined using capacitance-based contact and non-contact methods, where the dielectric material is sandwiched between the electrodes of a dielectric test fixture. A precision LCR meter measures the capacitance of solid dielectric materials, and results from contact and non-contact methods align well up to 1 MHz. Measurement uncertainty is evaluated according to the Guide to the Expression of Uncertainty in Measurement, with a detailed discussion of contributing factors.

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Publication Details

Journal
ACTA IMEKO
Published
2025-06-11
DOI
https://doi.org/10.21014/actaimeko.v14i2.1739
Citations
1
Primary Topic
Sensor Technology and Measurement Systems
Type
article
Field-Weighted Citation Impact
1.49

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article

Establishment of measurement traceability of dielectric-constant measurement using contact and non-contact methods

S. Satish, Rajendra Singh, Jayeeta Biswas, Rajendra K. Meena et al.
1 citations
ACTA IMEKO
Sensor Technology and Measurement Systems
1.49
article

Establishment of measurement traceability of dielectric-constant measurement using contact and non-contact methods

S. Satish, Rajendra Singh, Jayeeta Biswas, Rajendra K. Meena, Priyanka Jain
article en
1 citations

Abstract

To meet industry demands, measurement traceability for the dielectric constant of solid reference materials has been established at audio and radio frequencies. The dielectric constant is determined using capacitance-based contact and non-contact methods, where the dielectric material is sandwiched between the electrodes of a dielectric test fixture. A precision LCR meter measures the capacitance of solid dielectric materials, and results from contact and non-contact methods align well up to 1 MHz. Measurement uncertainty is evaluated according to the Guide to the Expression of Uncertainty in Measurement, with a detailed discussion of contributing factors.

ACTA IMEKOVol. 14(2)
Delhi Technological University (IN), CSIR National Physical Laboratory of India (IN)
National Physical Laboratory
Openalex Percentile: Top 16%
Sensor Technology and Measurement Systems
1.49
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