Cable-Coupled Voltage Interference Effects on I/O Pins
In this paper, the radiation simulation model of the PCB connecting cable and the equivalent model of microprocessor I/O port are established to solve the problem of electromagnetic radiation interference on microprocessor I/O pin connecting cable. Three-dimensional electromagnetic field simulation software CST and circuit simulation software Cadence are used for simulation analysis. The simulation results show that the cable coupling interference voltage causes serious interference to the I/O pin. The interference voltage may lead to signal distortion, data error, or device instability. Through this series of analyses, we can provide guidance for the electromagnetic compatibility of electronic circuits.
Authors
- Jianguo Wan (ORCID: https://orcid.org/0000-0003-1321-7930)
- Xuegong Huang
Institutions
- Nanjing University of Science and Technology (CN)
Publication Details
- Published
- 2025-04-11
- DOI
- https://doi.org/10.1109/icmtim65484.2025.11040786
- Primary Topic
- Electrostatic Discharge in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.00