Cable-Coupled Voltage Interference Effects on I/O Pins

In this paper, the radiation simulation model of the PCB connecting cable and the equivalent model of microprocessor I/O port are established to solve the problem of electromagnetic radiation interference on microprocessor I/O pin connecting cable. Three-dimensional electromagnetic field simulation software CST and circuit simulation software Cadence are used for simulation analysis. The simulation results show that the cable coupling interference voltage causes serious interference to the I/O pin. The interference voltage may lead to signal distortion, data error, or device instability. Through this series of analyses, we can provide guidance for the electromagnetic compatibility of electronic circuits.

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Publication Details

Published
2025-04-11
DOI
https://doi.org/10.1109/icmtim65484.2025.11040786
Primary Topic
Electrostatic Discharge in Electronics
Type
article
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article

Cable-Coupled Voltage Interference Effects on I/O Pins

Jianguo Wan, Xuegong Huang
Electrostatic Discharge in Electronics
article

Cable-Coupled Voltage Interference Effects on I/O Pins

Jianguo Wan, Xuegong Huang
article en

Abstract

In this paper, the radiation simulation model of the PCB connecting cable and the equivalent model of microprocessor I/O port are established to solve the problem of electromagnetic radiation interference on microprocessor I/O pin connecting cable. Three-dimensional electromagnetic field simulation software CST and circuit simulation software Cadence are used for simulation analysis. The simulation results show that the cable coupling interference voltage causes serious interference to the I/O pin. The interference voltage may lead to signal distortion, data error, or device instability. Through this series of analyses, we can provide guidance for the electromagnetic compatibility of electronic circuits.

Nanjing University of Science and Technology (CN)
Affordable and clean energy
Openalex Percentile: Top 86%
Electrostatic Discharge in Electronics
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