Heterogeneous Integration of Compound Semiconductor Materials and Devices by Ion-Cutting Technique
The heterogeneous integration of compound semiconductors with Si substrates can combine the cost advantage and maturity of Si technology with the superior performance of compound semiconductors, enabling a new class of highperformance integrated circuits with multiple functionalities for the post-Moore era. This work provides a brief description of the ion-cutting technique, which basically consists of ion implantation, wafer bonding, annealing to achieve exfoliation, and polishing. In addition to the industrial production of silicon-on-insulator (SOI) wafers with diameters up to 300 mm, several non-silicon semiconductor thin films, such as III-V compound semiconductors and wide bandgap semiconductors, have been exfoliated and transferred to foreign substrates using the ion-cutting technique.
Authors
- Jiaxin Ding (ORCID: https://orcid.org/0009-0001-9981-712X)
- Jialiang Sun (ORCID: https://orcid.org/0009-0000-5901-6013)
- Xin Ou (ORCID: https://orcid.org/0000-0002-0316-9958)
- Shangyu Yang (ORCID: https://orcid.org/0000-0002-7166-2779)
- Tian Liang (ORCID: https://orcid.org/0000-0001-9459-9920)
- Tiangui You
Institutions
- Chinese Academy of Sciences (CN)
- Shanghai Institute of Microsystem and Information Technology (CN)
Publication Details
- Published
- 2025-03-09
- DOI
- https://doi.org/10.1109/edtm61175.2025.11040187
- Primary Topic
- Semiconductor materials and devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Science Foundation