50 NM Gan Hemts Technology with High Frequency, Low Noise, and High JFoM
Our 50 nm GaN HEMTs with source-to-drain length (<tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mathrm{L}_{\text{sd}}$</tex>) of 200 nm reached cut-off frequencies <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mathrm{f}_{\mathrm{T}} / \mathrm{f}_{\text {max }}$</tex> of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$230 / 525 \text{GHz}$</tex>. W-band load-pull measurements indicate a 7.4 dB linear gain, 15.8 dBm output power, and 15 % efficiency. A low noise figure of 1 dB is achieved from <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$25-35 \text{GHz}$</tex>. Devices with 5 <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mu \mathrm{m} \mathrm{L}_{\text{sd}}$</tex> exhibited a breakdown voltage of 180 V and a <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mathrm{f}_{\mathrm{T}}$</tex> of 117 GHz, resulting in a JFoM of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$21 \text{THz} \cdot \mathrm{V}$</tex>.
Authors
- Shujie Xie (ORCID: https://orcid.org/0009-0006-1137-0201)
- Xuankun Wu
- Jiaheng He (ORCID: https://orcid.org/0000-0002-3724-0951)
- Zhe Cheng (ORCID: https://orcid.org/0000-0002-9127-241X)
- Yun Zhang (ORCID: https://orcid.org/0000-0002-6361-7193)
- Lian Zhang (ORCID: https://orcid.org/0000-0002-6049-2073)
- Changxin Mi
Institutions
- Chinese Academy of Sciences (CN)
- Institute of Semiconductors (CN)
Publication Details
- Published
- 2025-03-09
- DOI
- https://doi.org/10.1109/edtm61175.2025.11040783
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00