Dual Functionality of MoS<sub>2</sub> in nFET and pFET Through Contact Metal Selection
Traditional transistor fabrication requires separate doping processes for both n-type and p-type field-effect transistors (FETs), which becomes increasingly challenging as device dimensions shrink. This paper explores the dual functionality of MoS<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> in nFETs and pFETs through the selection of contact metals. N-type characteristics can be achieved in p-type MoS<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> by using a low workfunction semimetal, allowing for the fabrication of both nFETs and pFETs on the same channel material without additional doping. Our approach simplifies the fabrication process and minimizes inter-device gaps.
Authors
- Mansun Chan (ORCID: https://orcid.org/0000-0002-5104-7410)
- Ka Wai Wong (ORCID: https://orcid.org/0000-0001-8529-2126)
Institutions
- Hong Kong University of Science and Technology (HK)
- University of Hong Kong (HK)
Publication Details
- Published
- 2025-03-09
- DOI
- https://doi.org/10.1109/edtm61175.2025.11040839
- Primary Topic
- Advancements in Semiconductor Devices and Circuit Design
- Type
- article
- Field-Weighted Citation Impact
- 0.00