Temperature-Dependent Characteristics of Field-Effect Mobility in MOCVD-Grown β-Ga<sub>2</sub>O<sub>3</sub>MOSFETs on Sapphire Substrate

<tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\beta-\text{Ga}_{2}\mathrm{O}_{3}$</tex> MOSFETs were fabricated based on the heteroepitaxial <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\beta-\text{Ga}_{2}\mathrm{O}_{3}$</tex> film grown on the sapphire substrate by metalorganic chemical vapor deposition (MOCVD). Thanks to the high epitaxial quality and an optimized Si+ implantation and activation process, a high field effect mobility <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$(\mu_{\mathrm{F}\mathrm{E}})$</tex> of 35 cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>/V·s was achieved at a high carrier density <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$(n_{\mathrm{e}})$</tex> near the surface exceeding 10<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">18</sup> cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">−3</sup>. As the temperature rises, the density of ionized impurities increases, and Coulombic scattering becomes the dominant mechanism, resulting in the enhancement of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mu_{\mathrm{F}\mathrm{E}}$</tex> from 35 cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>/V·s to 55 cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>/V·s when the temperature increases from 25°C to 300°C. The <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mu_{\mathrm{F}\mathrm{E}}$</tex> is the highest reported for heteroepitaxial Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> devices on sapphire substrates.

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Published
2025-03-09
DOI
https://doi.org/10.1109/edtm61175.2025.11040329
Primary Topic
Ga2O3 and related materials
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article
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article

Temperature-Dependent Characteristics of Field-Effect Mobility in MOCVD-Grown β-Ga2O3MOSFETs on Sapphire Substrate

Haodong Hu, Bochang Li, Chunxiao Yu, Xiaole Jia et al.
Ga2O3 and related materials
article

Temperature-Dependent Characteristics of Field-Effect Mobility in MOCVD-Grown β-Ga2O3MOSFETs on Sapphire Substrate

Haodong Hu, Bochang Li, Chunxiao Yu, Xiaole Jia, Jun Zheng, Yan Liu, Yibo Wang, Yue Hao, Chenyu Liu, Genquan Han, Chao-Yi Fang, Yiyang Wu
article en

Abstract

<tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\beta-\text{Ga}_{2}\mathrm{O}_{3}$</tex> MOSFETs were fabricated based on the heteroepitaxial <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\beta-\text{Ga}_{2}\mathrm{O}_{3}$</tex> film grown on the sapphire substrate by metalorganic chemical vapor deposition (MOCVD). Thanks to the high epitaxial quality and an optimized Si+ implantation and activation process, a high field effect mobility <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$(\mu_{\mathrm{F}\mathrm{E}})$</tex> of 35 cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>/V·s was achieved at a high carrier density <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$(n_{\mathrm{e}})$</tex> near the surface exceeding 10<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">18</sup> cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">−3</sup>. As the temperature rises, the density of ionized impurities increases, and Coulombic scattering becomes the dominant mechanism, resulting in the enhancement of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mu_{\mathrm{F}\mathrm{E}}$</tex> from 35 cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>/V·s to 55 cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>/V·s when the temperature increases from 25°C to 300°C. The <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mu_{\mathrm{F}\mathrm{E}}$</tex> is the highest reported for heteroepitaxial Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> devices on sapphire substrates.

Xidian University (CN), Chinese Academy of Sciences (CN), State Key Laboratory on Integrated Optoelectronics (CN), Institute of Semiconductors (CN)
National Natural Science Foundation of China
Openalex Percentile: Top 91%
Ga2O3 and related materials
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