Temperature-Dependent Characteristics of Field-Effect Mobility in MOCVD-Grown β-Ga<sub>2</sub>O<sub>3</sub>MOSFETs on Sapphire Substrate
<tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\beta-\text{Ga}_{2}\mathrm{O}_{3}$</tex> MOSFETs were fabricated based on the heteroepitaxial <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\beta-\text{Ga}_{2}\mathrm{O}_{3}$</tex> film grown on the sapphire substrate by metalorganic chemical vapor deposition (MOCVD). Thanks to the high epitaxial quality and an optimized Si+ implantation and activation process, a high field effect mobility <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$(\mu_{\mathrm{F}\mathrm{E}})$</tex> of 35 cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>/V·s was achieved at a high carrier density <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$(n_{\mathrm{e}})$</tex> near the surface exceeding 10<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">18</sup> cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">−3</sup>. As the temperature rises, the density of ionized impurities increases, and Coulombic scattering becomes the dominant mechanism, resulting in the enhancement of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mu_{\mathrm{F}\mathrm{E}}$</tex> from 35 cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>/V·s to 55 cm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>/V·s when the temperature increases from 25°C to 300°C. The <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\mu_{\mathrm{F}\mathrm{E}}$</tex> is the highest reported for heteroepitaxial Ga<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf>O<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</inf> devices on sapphire substrates.
Authors
- Haodong Hu (ORCID: https://orcid.org/0000-0002-1139-1209)
- Bochang Li (ORCID: https://orcid.org/0000-0002-8195-6842)
- Chunxiao Yu
- Xiaole Jia
- Jun Zheng (ORCID: https://orcid.org/0000-0002-8622-2661)
- Yan Liu (ORCID: https://orcid.org/0000-0003-4724-6588)
- Yibo Wang (ORCID: https://orcid.org/0000-0002-4058-1319)
- Yue Hao (ORCID: https://orcid.org/0000-0001-7876-8878)
- Chenyu Liu (ORCID: https://orcid.org/0009-0006-7784-5230)
- Genquan Han
- Chao-Yi Fang
- Yiyang Wu
Institutions
- Xidian University (CN)
- Chinese Academy of Sciences (CN)
- State Key Laboratory on Integrated Optoelectronics (CN)
- Institute of Semiconductors (CN)
Publication Details
- Published
- 2025-03-09
- DOI
- https://doi.org/10.1109/edtm61175.2025.11040329
- Primary Topic
- Ga2O3 and related materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China