Device Considerations for GaN Power Switching Transistors from Application and Reliability Perspectives (Invited)

In this work, detailed analysis and discussion on the design of state-of-the-art enhancement and depletion-mode (E/Dmode) GaN power switching transistors considering application and reliability are presented. Key challenges and issues during the development phase are elaborated with a summary of potential solutions at device and circuit system levels providing useful technical reference for a designer using GaN device for targeting power electronics application with high energy efficiency and robustness.