975V/4.3M $\Omega \cdot \text{cm}^{2}$ Enhancement-Mode (001) $\beta-\text{Ga}_{2} \mathrm{O}_{3}$ Vertical Multi-Fin Power Transistors

This work reports a high-performance enhancement-mode <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\beta-\text{Ga}_{2} \mathrm{O}_{3}$</tex> multi-fin field-effect transistor (FinFET). Utilizing a non-metal mask etching and self-aligned process based on photoresist planarization. The <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\beta-\text{Ga}_{2} \mathrm{O}_{3}$</tex> FinFET exhibited a maximum output current density of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$361.5 \mathrm{A} / \text{cm}^{2}$</tex>, a peak transconductance of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$127 \mathrm{S} / \text{cm}^{2}$</tex>, a specific on-resistance of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$4.3 \mathrm{m} \Omega \cdot \text{cm}^{2}$</tex>, a breakdown voltage of 975 V, and a power figure of merit (PFOM) of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$0.22 \text{GW} / \text{cm}^{2}$</tex>. These results demonstrate the feasibility of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\beta-\text{Ga}_{2} \mathrm{O}_{3}$</tex> power transistors for large-area applications.

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Published
2025-03-09
DOI
https://doi.org/10.1109/edtm61175.2025.11040853
Primary Topic
Ga2O3 and related materials
Type
article
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article

975V/4.3M $\Omega \cdot \text{cm}^{2}$ Enhancement-Mode (001) $\beta-\text{Ga}_{2} \mathrm{O}_{3}$ Vertical Multi-Fin Power Transistors

Tiwei Chen, Gaofu Guo, Zheyuan Hu, Xianqi Dai et al.
Ga2O3 and related materials
article

975V/4.3M $\Omega \cdot \text{cm}^{2}$ Enhancement-Mode (001) $\beta-\text{Ga}_{2} \mathrm{O}_{3}$ Vertical Multi-Fin Power Transistors

Tiwei Chen, Gaofu Guo, Zheyuan Hu, Xianqi Dai, Chunhong Zeng, Zibo Li, Baoshun Zhang, Dengrui Zhao, Zhili Zou, Yuhua Sun, Xiaodong Zhang
article en

Abstract

This work reports a high-performance enhancement-mode <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\beta-\text{Ga}_{2} \mathrm{O}_{3}$</tex> multi-fin field-effect transistor (FinFET). Utilizing a non-metal mask etching and self-aligned process based on photoresist planarization. The <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\beta-\text{Ga}_{2} \mathrm{O}_{3}$</tex> FinFET exhibited a maximum output current density of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$361.5 \mathrm{A} / \text{cm}^{2}$</tex>, a peak transconductance of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$127 \mathrm{S} / \text{cm}^{2}$</tex>, a specific on-resistance of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$4.3 \mathrm{m} \Omega \cdot \text{cm}^{2}$</tex>, a breakdown voltage of 975 V, and a power figure of merit (PFOM) of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$0.22 \text{GW} / \text{cm}^{2}$</tex>. These results demonstrate the feasibility of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\beta-\text{Ga}_{2} \mathrm{O}_{3}$</tex> power transistors for large-area applications.

Chinese Academy of Sciences (CN), Suzhou Institute of Nano-tech and Nano-bionics (CN), Henan Normal University (CN)
National Natural Science Foundation of China, Chinese Academy of Sciences, Fund for Key Laboratory Construction of Hubei Province, Suzhou Institute of Nanotechnology, Chinese Academy of Sciences, National Key Research and Development Program of China
Affordable and clean energy
Openalex Percentile: Top 91%
Ga2O3 and related materials
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