Field-free fractional Chern insulators in twisted bilayers via nonlinear strain

We provide a new method for exploiting nonlinear strain interactions to stabilize fractional Chern insulators in twisted bilayer systems in the absence of external magnetic fields. A Dirac model with strain-induced nonlinearities reveals topological phases with Chern numbersC=1/3and2/3, driven by lattice deformations that flatten bands and boost correlations. Using scanning tunneling microscopy, the correlation gapΔgapscales with interaction intensity, offering a testable signature (0.01-0.028 eV). By using intrinsic strain, this field-free method outperforms moiré-based techniques and may be used to 2D materials such as graphene and transition-metal dichalcogenides.

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Publication Details

Journal
Journal of Physics Condensed Matter
Published
2025-06-30
DOI
https://doi.org/10.1088/1361-648x/adea27
Citations
3
Primary Topic
Topological Materials and Phenomena
Type
article
Field-Weighted Citation Impact
3.74
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article

Field-free fractional Chern insulators in twisted bilayers via nonlinear strain

Farshad Azizi
3 citations
Journal of Physics Condensed Matter
Topological Materials and Phenomena
3.74
article

Field-free fractional Chern insulators in twisted bilayers via nonlinear strain

Farshad Azizi
article en
3 citations

Abstract

We provide a new method for exploiting nonlinear strain interactions to stabilize fractional Chern insulators in twisted bilayer systems in the absence of external magnetic fields. A Dirac model with strain-induced nonlinearities reveals topological phases with Chern numbersC=1/3and2/3, driven by lattice deformations that flatten bands and boost correlations. Using scanning tunneling microscopy, the correlation gapΔgapscales with interaction intensity, offering a testable signature (0.01-0.028 eV). By using intrinsic strain, this field-free method outperforms moiré-based techniques and may be used to 2D materials such as graphene and transition-metal dichalcogenides.

Journal of Physics Condensed MatterVol. 37(28)
Jundi-Shapur University of Technology (IR)
Openalex Percentile: Top 7%
Topological Materials and Phenomena
3.74
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