In-plane and out-of-plane 4-DOF encoder based on grating
Multi-degree-of-freedom measurement technology plays a significant role in precision manufacturing, optical inspection, and robotic control applications. To address the demand for high-precision measurements, this study introduces a four-degree-of-freedom(4-DOF) grating system that utilizes grating interference and ray tracing principles, enabling simultaneous high-accuracy XY displacement and XY angles. The system measures in- plane displacement using grating interference, while the out-of-plane angular variations are resolved by tracking the position changes of diffracted light on a four-quadrant photodetector (QPD). Experimental findings indicate that the in-plane displacement measurement exhibits minimal error and high repeatability. The error margin is approximately ±2 microns within an 8000 microns range. The out-of-plane angular measurement error remains below 10 arcsec across a 300 arcsec range, with the capability to detect out-of-plane motion. The system offers an innovative approach to high-precision multi-degree-of-freedom measurement and demonstrates significant potential for various applications.
Authors
- Shengtong Wang (ORCID: https://orcid.org/0000-0002-5888-9864)
- Feifan Cao (ORCID: https://orcid.org/0009-0002-4806-5236)
- xinghui li
- Linbin Luo (ORCID: https://orcid.org/0009-0001-1297-4086)
- Sihan Lu
Institutions
- Tsinghua University (CN)
Publication Details
- Published
- 2025-06-30
- DOI
- https://doi.org/10.1117/12.3067203
- Citations
- 2
- Primary Topic
- Advanced Measurement and Metrology Techniques
- Type
- article
- Field-Weighted Citation Impact
- 1.43