Black-Box Modeling Approach with PGB Metric for PSRR Prediction in Op-Amps
The rapid advancement of electronic technology demands circuit designs that minimize power consumption while maximizing performance. The power supply rejection ratio (PSRR) is a critical metric for quantifying an amplifier’s ability to suppress supply noise, yet accurately predicting PSRR in high-frequency domains and complex multi-stage architectures is increasingly challenging. In this work, we introduce a new framework for PSRR prediction that overcomes these limitations. Leveraging a simplified circuit abstraction based on Thevenin’s theorem, we reduced multi-stage operational amplifiers to “black-box” models—collapsing intricate small-signal networks into a tractable form without sacrificing accuracy. Building on this foundation, we proposed the Power-Supply Rejection Gain-Bandwidth (PGB) metric, which concisely captures the trade-off between an amplifier’s DC PSRR and the frequency range over which that rejection is effective. Using PGB, designers gain an intuitive figure-of-merit for early-stage optimization of PSRR. We validated the efficacy of the combined black-box modeling and PGB approach through detailed case studies, including a 180 nm CMOS two-stage op-amp design. These findings confirmed that the proposed black box plus PGB framework can reliably guide the design of analog circuits with stringent PSRR requirements.
Authors
- Ruonan Lin
- Xin Yang
- Tianlong Li (ORCID: https://orcid.org/0000-0002-9483-457X)
- Jianpu Lin (ORCID: https://orcid.org/0009-0009-4521-3521)
- Jiwei Huang (ORCID: https://orcid.org/0000-0001-5220-6703)
- Yi Zhang (ORCID: https://orcid.org/0009-0006-6239-051X)
Institutions
- Zhejiang Zanyu Technology (China) (CN)
- Fuzhou University (CN)
Publication Details
- Journal
- Electronics
- Published
- 2025-06-30
- DOI
- https://doi.org/10.3390/electronics14132648
- Primary Topic
- Fault Detection and Control Systems
- Type
- article
- Field-Weighted Citation Impact
- 0.00