Local Electrical Properties of Polyaniline-ZnO Nanocomposite Langmuir-Blodgett Thin Films Investigated Using Conductive Atomic Force Microscopy

The localized electrical properties of Langmuir-Blodgett (LB) thin films of polyaniline (PANi) dispersed with Zinc oxide (ZnO) nanoparticles were investigated using Conductive Atomic Force Microscopy (CAFM). The nanoscale electrical conductivity of PANi-ZnO nanocomposites was analyzed by mapping current distribution and evaluating single-point current-voltage (I-V) characteristics. The CAFM results indicate a uniform charge transport network, reduced defect density, and enhanced conductivity in ZnO-incorporated films. The CAFM current mapping revealed a uniform distribution of conductive domains across the film surfaces, showing homogeneity of nanocomposite thin films. These insights contribute to the understanding of the electrical behavior of PANi-based nanocomposites, which holds promising potential for applications in electronic devices.