CapPUF: A Tamper-Resistant PUF Utilizing I/O Capacitances for IoT Nodes

We introduce CapPUF, a Physical Unclonable Function (PUF) that utilizes parasitic capacitances of I/O pins to generate unique identifiers (IDs) for Integrated Circuits (ICs) and the IoT nodes encompassing them. CapPUF is based on the observation that the I/O capacitance of each IC is unique and varies from one IC to another. It utilizes the capacitive sensing hardware commonly found in modern microcontroller ICs with touch-sensing capabilities, to measure I/O capacitances and generate the PUF ID. CapPUF also offers tamper resistance. It is thus challenging to reverse-engineer the PUF ID through physical probing of the I/Os. We evaluated CapPUF using 30 different PSoC-5 microcontroller ICs from Infineon Technologies. By measuring the parasitic capacitances of 18 I/Os, CapPUF generated a 153-bit PUF ID for each IC. Performance evaluation based on standard PUF metrics yielded promising results, including a reliability of 99.79%, uniqueness of 43.11%, and uniformity of 44.64%. Testing across various temperature and voltage settings demonstrated the PUF’s stability. Additionally, we demonstrated CapPUF’s resistance to probing attacks.

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Published
2025-05-25
DOI
https://doi.org/10.1109/iscas56072.2025.11043582
Primary Topic
Advanced Sensor and Energy Harvesting Materials
Type
article
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article

CapPUF: A Tamper-Resistant PUF Utilizing I/O Capacitances for IoT Nodes

Kurian Polachan, Dilli Babu Porlapothula
Advanced Sensor and Energy Harvesting Materials
article

CapPUF: A Tamper-Resistant PUF Utilizing I/O Capacitances for IoT Nodes

Kurian Polachan, Dilli Babu Porlapothula
article en

Abstract

We introduce CapPUF, a Physical Unclonable Function (PUF) that utilizes parasitic capacitances of I/O pins to generate unique identifiers (IDs) for Integrated Circuits (ICs) and the IoT nodes encompassing them. CapPUF is based on the observation that the I/O capacitance of each IC is unique and varies from one IC to another. It utilizes the capacitive sensing hardware commonly found in modern microcontroller ICs with touch-sensing capabilities, to measure I/O capacitances and generate the PUF ID. CapPUF also offers tamper resistance. It is thus challenging to reverse-engineer the PUF ID through physical probing of the I/Os. We evaluated CapPUF using 30 different PSoC-5 microcontroller ICs from Infineon Technologies. By measuring the parasitic capacitances of 18 I/Os, CapPUF generated a 153-bit PUF ID for each IC. Performance evaluation based on standard PUF metrics yielded promising results, including a reliability of 99.79%, uniqueness of 43.11%, and uniformity of 44.64%. Testing across various temperature and voltage settings demonstrated the PUF’s stability. Additionally, we demonstrated CapPUF’s resistance to probing attacks.

International Institute of Information Technology Bangalore (IN)
Affordable and clean energy
Openalex Percentile: Top 86%
Advanced Sensor and Energy Harvesting Materials
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CapPUF: A Tamper-Resistant PUF Utilizing I/O Capacitances for IoT Nodes — Kurian Polachan, Dilli Babu Porlapothula · (2025) | TGRS Research Map | TGRS