A 400V Monolithic GaN-on-SOI Half-Bridge with On-Chip Accurate Current Detection for Isolated Power Converters
This paper presents a high-precision, low-loss, fully on-chip current detection scheme for a monolithic integrated GaN half-bridge in high-voltage isolated converters. The proposed design integrates power switches, gate drivers, an on-chip current sensor and a relative-negative voltage supply using a GaN-on-SOI process, addressing challenges posed by parasitic inductance and signal transmission delays. To enhance detection accuracy and minimize power loss, a sense-HEMT scheme with an amplifier clamping loop featuring auto-zeroing is utilized. The simulation results show that the current detection accuracy of the proposed design surpasses 96%, and is sucessfully demostrated in an active clamp flyback converter. Additionally, a multi-stage self-cycling and bootstrap driver is proposed, characterized by driving delays of ton=6.5 ns and toff=6.3 ns, and proving a rail-to-rail driving voltage.
Authors
- Yuchuan Han
- Yuan Gao (ORCID: https://orcid.org/0000-0001-8565-1790)
- Yue Wang (ORCID: https://orcid.org/0000-0001-5642-1099)
- Xiangyu He (ORCID: https://orcid.org/0009-0006-3729-4286)
Institutions
- Southern University of Science and Technology (CN)
Publication Details
- Published
- 2025-05-25
- DOI
- https://doi.org/10.1109/iscas56072.2025.11043420
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China