A Compact 3-Segment 15-bit Capacitive DAC with Digital Calibration for Improved Linearity
This paper proposes a novel redundancy-based approach to drastically relax the matching requirements of CDACs and employing a cost-effective digital calibration method to improve linearity. The proposed architecture features a 3-segment CDAC with two redundant bits, which effectively reduces the overall DAC area and improves the DAC’s linearity. A 15-bit version of the DAC has been implemented in TSMC 0.18 μm technology, occupying a total area of 0.010 mm<sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup>. The design is validated through simulations in Cadence Spectre and calibration in MATLAB, resulting in worst-case integral nonlinearity (INL) and differential nonlinearity (DNL) of less than 0.5 LSB and 1 LSB, respectively, across 200 Monte-Carlo iterations.
Authors
- Isaac Bruce (ORCID: https://orcid.org/0000-0003-3959-1293)
- Kushagra Bhatheja (ORCID: https://orcid.org/0000-0003-3283-7449)
- Ekaniyere Oko-Odion
- Emmanuel Nti Darko (ORCID: https://orcid.org/0009-0003-8237-2384)
- Degang J. Chen (ORCID: https://orcid.org/0000-0002-5938-6329)
- Saeid Karimpour (ORCID: https://orcid.org/0009-0009-6669-8812)
Institutions
- Iowa State University (US)
- Texas Instruments (United States) (US)
Publication Details
- Published
- 2025-05-25
- DOI
- https://doi.org/10.1109/iscas56072.2025.11043602
- Primary Topic
- Analog and Mixed-Signal Circuit Design
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Semiconductor Research Corporation